Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)

Computational

von Peter Pichler

Gebunden

ISBN-13: 978-3-211-20687-4

ISBN-10: 3-211-20687-6

Springer · 2004

S. auch:
2012TaschenbuchIntrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)