Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering (252), Band 252)

Electrical

von: Xiao Liu · Qiang Xu

Gebunden

ISBN-13: 978-3-319-00532-4

ISBN-10: 3-319-00532-4

Springer · 2013
Siehe auch:
2016TaschenbuchTrace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, Band 252)
2013PaperbackTrace-Based Post-Silicon Validation for VLSI Circuits