Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics (179), Band 179)

Determination

von Yoshio Waseda

Gebunden

ISBN-13: 978-3-540-43443-6

ISBN-10: 3-540-43443-7

Springer · 2002
S. auch:
2013TaschenbuchAnomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics, Band 179)