The Silicon Carbide MOS Capacitor: A Study of Defects, Generation Lifetimes, Leakage Currents, and Other Interesting Nonidealities in the Non-equilibrium SiC/SiO2 MOS Capacitor
von
Marinella Matthew
Taschenbuch
Details (
Deutschland
)
ISBN: 978-3-639-08905-9
ISBN-10: 3-639-08905-7
VDM Verlag
· 2008
