Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

Spectroscopy

von Nicolò Barbero

Taschenbuch

Details (Deutschland)

EAN=ISBN-13: 978-3-639-77304-0

ISBN-10: 3-639-77304-7

Edizioni Accademiche Italiane · 2015