Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences, Band 35)

Experimental

von Jacques Bourgoin

Taschenbuch

ISBN: 978-3-642-81834-9

ISBN-10: 3-642-81834-X

Springer Berlin Heidelberg · 1983

S. auch (eventuell von anderen Autoren):
1983Gebundene AusgabePoint Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)
1983HardcoverPoint Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-state Sciences)