Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics (182), Band 182)

von Andreas Rosenauer

Taschenbuch

ISBN: 978-3-662-14618-7

ISBN-10: 3-662-14618-5

Siehe auch:
2003	Gebundene Ausgabe	Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics, Band 182)