Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)

NanoScience

von Bert Voigtländer

Taschenbuch

ISBN: 978-3-662-50557-1

ISBN-10: 3-662-50557-6

Springer · 2016
S. auch:
2015Gebundene AusgabeScanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)