TDCV CHARACTERIZATION OF DEFECTS IN ULTRA THIN SIO2 KINDS OF FILMS: TDCV = Temperature Dependent Capacitance Voltage

Temperature

von Jean-Yves Rosaye

Taschenbuch

Details (Deutschland)

ISBN-13: 978-3-8383-5154-4

ISBN-10: 3-8383-5154-1

LAP Lambert Academic Publishing · 2010