A Physically Based Reliability Modelling Framework for nm-CMOS RF Devices and Circuits undergoing RF Stress (Elektrotechnik)
von
Andrea Cattaneo
Taschenbuch
Details (
Deutschland
)
ISBN-13: 978-3-8439-2393-4
ISBN-10: 3-8439-2393-0
Dr. Hut
· 2015
