An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs

Asirvadam

von: Jahanzeb Anwer · Nor Hisham Bin Hamid · Vijanth Sagayan Asirvadam

Taschenbuch

Details (Deutschland)

ISBN-13: 978-3-8443-3263-6

ISBN-10: 3-8443-3263-4

LAP LAMBERT Academic Publishing · 2011