Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling: A Festschrift for Peter Heymann

Festschrift

von: R. Doerner · Abraham M. Rudolph

Taschenbuch

ISBN: 978-3-86537-328-1

ISBN-10: 3-86537-328-3

Cuvillier, E · 2015