Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)

Breitenstein

von: Otwin Breitenstein · Wilhelm Warta · Martin C. Schubert

Gebunden

ISBN-13: 978-3-319-99824-4

ISBN-10: 3-319-99824-2

Springer · Januar 2019
S. auch:
2012TaschenbuchLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)
2010Gebundene AusgabeLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)