Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)

Breitenstein

von: Otwin Breitenstein · Wilhelm Warta · Martin Langenkamp

Gebunden

EAN=ISBN-13: 978-3-642-02416-0

ISBN-10: 3-642-02416-5

Springer · 2010
Siehe auch:
2018Gebundene AusgabeLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)
2012TaschenbuchLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)
2003Gebundene AusgabeLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)