Near-field Characterization of Photonic Nanodevices: Near-field Scanning Optical Microscopy (NSOM) characterization of photonic nanodevices and nanoscale optical phenomena

von Maxim Abashin Taschenbuch Details (Deutschland) ISBN-13: 978-3-8383-0711-4 ISBN-10: 3-8383-0711-9 LAP Lambert Academic Publishing · 2009